Publikation

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Publikation, 2010

Outline

H. Huber, M. Moertelmaier, T. Wallis, C. Chiang, M. Hochleitner, A. Imtiaz, Y. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. Rosner, H. Tanbakuchi, P. Kabos, F. Kienberger - Calibrated nanoscale capacitance measurements using a scanning microwave microscope - Review of Scientific Instruments, Vol. 81, No. 11, 2010