Publikation

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Publikation

Outline

H. Huber, M. Moertelmaier, T. Wallis, C. Chiang, M. Hochleitner, A. Imtiaz, Y. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. Rosner, H. Tanbakuchi, P. Kabos, F. Kienberger - Calibrated nanoscale capacitance measurements using a scanning microwave microscope - Review of Scientific Instruments, Vol. 81, No. 11, 2010