Publikation

Non-destructive characterization of heterogeneous materials in sub-micron range using Cone-beam X-ray computed tomography

Outline:

B. Plank, B. Harrer, D. Salaberger, J. Kastner - Non-destructive characterization of heterogeneous materials in sub-micron range using Cone-beam X-ray computed tomography - Proceedings of the fifth Research Forum of the Austrian University of Applied Sciences, Wien (Favoriten), Austria, 2011, pp. 232-235