Publikation
X-ray Microtomography: characterisation of structures and defect analysis
Outline:
B. Harrer, J. Kastner - X-ray Microtomography: characterisation of structures and defect analysis in Fabrication and Characterization in the Micro-Nano Range - Springer Verlag, 2011, pp. 119-150
2011
Forschungsgebiete:
Personen:
- Prof. (FH) Priv.Doz. Dipl.-Ing. Dr. Johann Kastner
- Dr. techn. Bernhard Harrer
