High-temperature dual-band thermal imaging by means of high-speed CMOS camera system
W. Hauer, G. Zauner - High-temperature dual-band thermal imaging by means of high-speed CMOS camera system - SPIE Electronic Imaging 2013: Machine Vision Applications VI, San Francisco, Vereinigte Staaten von Amerika, 2013
When measuring rapid temperature change as well as measuring high temperatures (>2000 K) commercial pyrometers reach the limits of their performance very quickly. Thus a novel type of high temperature measurement system using a high-speed camera as a two-color pyrometer is introduced. In addition to the high temporal resolution, ranging between 10 μs – 100 μs, the presented system also allows the determination of the radiation temperature distribution at a very high spatial resolution. The principle of operation including various image processing algorithms and filters is explained by means of a concrete example, where the surface temperature decay of a carbon electrode heated by an electric arc is measured.
- DI (FH) Dr. Gerald Zauner
- Dr. Dipl.-Ing. (FH) Wolfgang Hauer