Publikation

Atomic Force microscopy, A New Supporting Tool in Brain Tumor Diagnosis

Outline:

M. Plöderl, G. Zauner, R. Silye, S. Hutterer, K. Schilcher - Atomic Force microscopy, A New Supporting Tool in Brain Tumor Diagnosis - Nanoscale 2011, Santa Barbara, Vereinigte Staaten von Amerika, 2011, pp. 82