Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation

Outline:

M. Reiter, B. Harrer, D. Salaberger, C. Heinzl, C. Gusenbauer, C. Kuhn, J. Kastner - Simulation aided study for optimising device parameters of an industrial X-ray computed tomography system for non-destructive testing and materials characterisation - International Symposium on Digital Industrial Radiology and Computed Tomography 2011, Berlin, Deutschland, 2011