Publikation

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Outline:

H. Huber, M. Moertelmaier, T. Wallis, C. Chiang, M. Hochleitner, A. Imtiaz, Y. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. Rosner, H. Tanbakuchi, P. Kabos, F. Kienberger - Calibrated nanoscale capacitance measurements using a scanning microwave microscope - Review of Scientific Instruments, Vol. 81, No. 11, 2010